Seredin, P. V., Kosheleva, O. K., Goloshchapov, D. L., Buylov, N. S., Peshkov, Y. A., Mizerov, A. M., Timoshnev, S. N., Sobolev, M. S., & Sharofidinov, S. S. (2025). Diffractometric studies of the PA MBE grown of GaN layers on silicon substrates without their nitridation and an intermediate AlN nucleation layers. Kondensirovannye Sredy I Mezhfaznye Granitsy = Condensed Matter and Interphases, 27(2), 308-315. https://doi.org/10.17308/kcmf.2025.27/12810