Анализ фазового состава аморфной пленки Mo-Si,полученной ионно-лучевым распылением по данным УМРЭС и рентгеновской рефлектометрии
DOI:
https://doi.org/10.17308/kcmf.2026.28/13804Keywords:
сверхпроводимость, Mo3Si, пленки Mo-Si, аморфные силициды, ионно-лучевое распыление, ультрамягкая рентгеновская эмиссионная спектроскопия, рентгеновская рефлектометрияAbstract
Downloads
References
1. Banerjee A., Baker L. J., Doye, A., … Hadfield, R. H. Characterisation of amorphous molybdenum silicide (MoSi) superconducting thin films and nanowires. Superconductor Science and Technology. 2017;30(8): 084010. https://doi.org/10.1088/1361-6668/aa76d8
2. Grotowski S., Zugliani L., Jonas B., … Finley J. Optimizing the growth conditions of superconducting MoSi thin films for single photon detection. Scientific Reports. 2025;15(1): 2438. https://doi.org/10.1038/s41598-025-86303-5
3. Esmaeil Zadeh I., Chang J., Los J. W. N., … Zwiller V. Superconducting nanowire single-photon detectors: a perspective on evolution, state-of-the-art, future developments, and applications. Applied Physics Letters. 2021;118(19). https://doi.org/10.1063/5.0045990
4. Tütüncü H. M., Bağcı S., Srivastava G. P. Electronic structure, phonons, and electron-phonon interaction in Mo3Si. Physical Review B. 2010;82(21): 214510. https://doi.org/10.1103/PhysRevB.82.214510
5. Nakajima H., Ikebe M., Muto Y., Fujimori H. Superconducting properties of Mo/Si multilayer films. Journal of Applied Physics. 1989;65(4): 1637–1643. https://doi.org/10.1063/1.342931
6. Johnson W. L., Tsuei C. C., Raider S. I., Laibowitz R. B. A study of amorphous superconducting transition metal-metalloid alloys produced by coevaporation. Journal of Applied Physics. 1979;50(6): 4240–4245. https://doi.org/10.1063/1.326456
7. Villars P., Hulliger F. (eds.). Mo5Si3 rt superconducting transition temperature. Springer Materials (online database). Springer; Heidelberg (Dataset ID: ppp_93685f1283dc9fc025e4047e79afd71e).
8. Xu J., Hu W., Yan Y., Lu X., Munroe P., Xie Z.-H. Microstructure and mechanical properties of a Mo-toughened Mo3Si-based in situ nanocomposite. Vacuum. 2014;109: 112–119. https://doi.org/10.1016/j.vacuum.2014.07.004
9. Gnesin I., Gnesin B. Composition of the Mo-Mo3Si alloys obtained via various methods. International Journal of Refractory Metals and Hard Materials. 2020;88: 105188. https://doi.org/10.1016/j.ijrmhm.2020.105188
10. Gridnev S. A., Kalinin Yu. E., Sitnikov A. V., Stognei O. V. Nonlinear phenomena in nano- and microheterogeneous systems. Moscow: Binom Publ.; 2012. (In Russ.)
11. Gray A. X., Karel J., Minár J., … Fadley C. S. Hard X-ray photoemission study of near-Heusler FexSi1-x alloys. Physical Review B. 2011;83(19): 195112. https://doi.org/10.1103/PhysRevB.83.195112
12. Momma K., Izum F. Appl. VESTA 3 for three-dimensional visualization of crystal, volumetric and morphology data. Applied Crystallography. 2011;44(6): 1272–1276. https://doi.org/10.1107/S0021889811038970
13. Bergmann U., Glatzel P. X-ray emission spectroscopy. Photosynthesis Research. 2009;102(2-3): 255–266. https://doi.org/10.1007/s11120-009-9483-6
14. Shulakov A. S. X-ray emission depth-resolved spectroscopy for investigation of nanolayers. Journal of Structural Chemistry. 2011;52(S1): 1–12. https://doi.org/10.1134/S0022476611070018.
15. Glavic A., Björck M. GenX 3: the latest generation of an established tool. Applied Crystallography. 2022;55(4): 1063–1071. https://doi.org/10.1107/S1600576722006653
16. Parratt L. G. Surface studies of solids by total reflection of X-rays. Physical Review. 1954;95(2): 359. https://doi.org/10.1103/PhysRev.95.359
17. Jarrige I., Capron N., Jonnard P. Electronic structure of Ni and Mo silicides investigated by X-ray emission spectroscopy and density functional theory. Physical Review B. 2009;79(3): 035117. https://doi.org/10.1103/PhysRevB.79.035117
18. W. Speier E. v. Leuken, J. C. Fuggle D. D. Sarma, L. Kumar, B. Dauth K. H. J. Buschow. Photoemission and inverse photoemission of transition-metal silicides. Physical Review B. 1989;39(9): 6008. https://doi.org/10.1103/PhysRevB.39.6008
19. Speier W., Leuken E. V., Fuggle J. C., … Buschow K. H. J. Soft-X-ray-emission studies of bulk Fe3Si, FeSi, and FeSi2, and implanted iron silicides. Physical Review B. 1992;46(15): 9446. https://doi.org/10.1103/PhysRevB.46.9446
20. Domashevskaya E. P., Yurakov Yu A. Specific features of electron structures of some thin film d-silicides. Journal of Electron Spectroscopy and Related Phenomena. 1998;96(1-3): 195–208. https://doi.org/10.1016/S0368-2048(98)00236-9
21. Miyata N., Imazono T., Ishikawa S., Arai A., Yanagihara M., Watanabe M. Buried interfaces of heat-loaded Mo/Si multilayers studied by soft-X-ray emission spectroscopy. Surface Review and Letters. 2002;09(02): 663–667. https://doi.org/10.1142/S0218625X0200283X
22. Nemoshkalenko V. V., Shpak A. P., Krivitsky V. P., Nikolajev L. I. X-ray Kβ- and L2,3- emission bands of pure silicon and silicon in Mo-Si compounds Physics Letters A. 45.5 (1973): 369-370. https://doi.org/10.1016/0375-9601(73)90241-7
23. Weijs P. J. W., van Leuken H., de Groot R. A., … Buschow K. H. J. X-ray-emission studies of chemical bonding in transition-metal silicides. Physical Review B. 1991;44(15): 8195–8203. https://doi.org/10.1103/PhysRevB.44.8195
24. Daillant J., Gibaud A. (eds.). X-ray and neutron reflectivity: principles and applications. Vol. 770. Springer; 2008.
25. Poate J. M., Tu K. N., Mayer J. W. (eds.). Thin films: interdiffusion and reactions. John Wiley & Sons; 1978.
26. Ma H.-P., Yang J.-H., Yang J.-G., … Lu H.-L. Systematic study of the SiOx film with different stoichiometry by plasma-enhanced atomic layer deposition and its application in SiOx/SiO2 super-lattice. Nanomaterials. 2019;9(1): 55. https://doi.org/10.3390/nano9010055
27. Chu F., Thoma D. J., McClellan K. J., Peralta P. Mo5Si3 single crystals: physical properties and mechanical behavior. Materials Science and Engineering: A. 1999;261(1-2): 44–52. https://doi.org/10.1016/S0921-5093(98)01048-X
28. Suzuki K., H. Fujimori K. Hashimoto. Amorphous metals*. Moscow: Metallurgy Publ.; 1987. 328. (In Russ.)
29. Lefèvre A., Lewis L. J., Martinu L., Wertheimer M. R. Structural properties of silicon dioxide thin films densified by medium-energy particles. Physical Review B. 2001;64(11): 115429. https://doi.org/10.1103/PhysRevB.64.115429
30. Linke J., Rinder J., Hahn G., Terheiden B. Correlation between the optical bandgap and the monohydride bond density of hydrogenated amorphous silicon. Journal of Non-Crystalline Solids: 2020;X(5); 100044. https://doi.org/10.1016/j.nocx.2020.100044
31. Yanagisawa S., Fukuyama T. Preparation of molybdenum silicide films by reactive sputtering. Journal of The Electrochemical Society. 1980:127(5): 1120–1124. https://doi.org/10.1149/1.2129830
32. Beckman S., Cook B. A., Akinc M. Analysis of electrical resistivity of compositions within the Mo-Si-B ternary system, part I: single phase compounds. Materials Science and Engineering: A. 2001;298(1-2): 120–126. https://doi.org/10.1016/S0921-5093(00)01290-9
33. Ito K., Hayashi T., Nakamura H. Electrical and thermal properties of single crystalline Mo5X3 (X= Si, B, C) and related transition metal 5-3 silicides. Intermetallics. 2004;12(4): 443–450. https://doi.org/10.1016/j.intermet.2003.12.008
34. Huebener R. P. Nonlinear effects at high flux-flow electric fields. Journal of Physics: Condensed Matter. 2009;21(25): 254208. https://doi.org/10.1088/0953-8984/21/25/254208
35. Angelucci R., Solmi S., Armigliato A., … Canteri R. Boron ion implantation through Mo and Mo silicide layers for shallow junction formation. Journal of Applied Physics. 1991;69(7): 3962–3967. https://doi.org/10.1063/1.348457
36. Angelucci R., Solmi S., Armigliato A., … Poggi A. Arsenic ion implantation through Mo and Mo silicide layers for shallow junction formation. Solid-State Electronics. 1992;35(7): 941–947. https://doi.org/10.1016/0038-1101(92)90323-5
37. Martin T. L., Mahan J. E. Electronic transport and microstructure in MoSi2 thin films. Journal of Materials Research. 1986;1(3): 493–502. https://doi.org/10.1557/JMR.1986.0493
Downloads
Published
Issue
Section
License
Copyright (c) 2026 Kondensirovannye sredy i mezhfaznye granitsy = Condensed Matter and Interphases

This work is licensed under a Creative Commons Attribution 4.0 International License.








