Современные научные и практические решения в технологии изготовления подложек полупроводниковых соединений А3В5. Обзор

  • Елена Николаевна Абрамова АО «Гиредмет» ПАО «Росатом», ул. Электродная, д. 2., стр.1, Москва 111524, Российская Федерация https://orcid.org/0009-0002-7724-804X
  • Роман Юрьевич Козлов АО «Гиредмет» ПАО «Росатом», ул. Электродная, д. 2., стр.1, Москва 111524, Российская Федерация
  • Анатолий Ильич Хохлов АО «Гиредмет» ПАО «Росатом», ул. Электродная, д. 2., стр.1, Москва 111524, Российская Федерация
  • Юрий Вячеславович Сыров АО «Гиредмет» ПАО «Росатом», ул. Электродная, д. 2., стр.1, Москва 111524, Российская Федерация https://orcid.org/0000-0003-2226-5790
  • Юрий Николаевич Пархоменко ФГАОУ ВО «Национальный исследовательский технологический университет «МИСИС», Ленинский пр-кт, д. 4, стр. 1, Москва 119049, Российская Федерация https://orcid.org/0000-0002-1970-9867
Ключевые слова: полупроводниковые пластины, материалы А3В5, шлифовка, полировка, химико-механическая полировка, пассивация поверхности

Аннотация

Сегодня в электронном и оптическом приборостроении в качестве подложек для эпитаксиального роста широко используются монокристаллические полупроводниковые материалы А3В5 – GaAs, GaSb, InAs, InSb, InP. Данные материалы получают в виде массивных монокристаллических слитков. В связи с этим именно для них разрабатываются технологии изготовления и обработки пластин, используемых в качестве подложек для операций эпитаксиального роста. Миниатюризация современных систем и приборов обуславливает высокие требования к качеству поверхности этих подложек. Одним из основных критериев является низкая шероховатость (Ra) поверхности порядка 0.5 нм. Достижение таких значений требует усовершенствования методов обработки поверхности.

В статье проанализированы современные подходы к обработке поверхности полупроводниковых пластин моно-кристаллических материалов А3В5. Рассмотрены особенности шлифовки полупроводниковых пластин как этапа, предшествующего полировке. Проведен анализ методов полировки и установлено, что наибольшее развитие и распространение сегодня имеет химико-механическая полировка пластин А3В5, для которой рассмотрены основные параметры и систематизированы теоретические подходы. Выявлены ключевые тенденции развития технологии
химико-механической обработки полупроводниковых пластин А3В5 для получения пластин высокого качества. Приведены и проанализированы современные исследования различных методик химической полировки, как возможного аналога химико-механической обработки поверхности. Также рассмотрены методики пассивации поверхности после получения пластин с низкой шероховатостью. Пассивацию проводят для снижения реакционной способности поверхности и стабилизации электронных состояний в приповерхностных слоях пластины.

Предложено классифицировать подходы к пассивации на основе получаемого химического состава поверхности, когда пассивирующие слои создают при помощи окисления, сульфидирования, нитрирования. Также предложена классификация по способам создания пассивирующих покрытий с выделением химических методов при обработке поверхности в растворах и физико-химических методов

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Биографии авторов

Елена Николаевна Абрамова, АО «Гиредмет» ПАО «Росатом», ул. Электродная, д. 2., стр.1, Москва 111524, Российская Федерация

к. х. н., в. н. с., АО «Гиредмет», ПАО «Росатом» (Москва, Российская Федерация)

Роман Юрьевич Козлов, АО «Гиредмет» ПАО «Росатом», ул. Электродная, д. 2., стр.1, Москва 111524, Российская Федерация

аспирант 4-го года об учения, НИТУ «МИСИС», начальник лаборатории, АО «Гиредмет», ПАО «Росатом» (Москва, Российская Федерация)

Анатолий Ильич Хохлов, АО «Гиредмет» ПАО «Росатом», ул. Электродная, д. 2., стр.1, Москва 111524, Российская Федерация

к. т. н., в. н. с., АО «Гиредмет», ПАО «Росатом» (Москва, Российская Федерация)

Юрий Вячеславович Сыров, АО «Гиредмет» ПАО «Росатом», ул. Электродная, д. 2., стр.1, Москва 111524, Российская Федерация

к. ф.–м. н., в. н. с., АО «Гиредмет», ПАО «Росатом» (Москва, Российская Федерация)

Юрий Николаевич Пархоменко, ФГАОУ ВО «Национальный исследовательский технологический университет «МИСИС», Ленинский пр-кт, д. 4, стр. 1, Москва 119049, Российская Федерация

д. ф.-м. н., профессор кафедры материаловедения полупроводников и диэлектриков, НИТУ «МИСИС» (Москва, Российская Федерация)

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Опубликован
2024-01-31
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Абрамова, Е. Н., Козлов, Р. Ю., Хохлов, А. И., Сыров, Ю. В., & Пархоменко, Ю. Н. (2024). Современные научные и практические решения в технологии изготовления подложек полупроводниковых соединений А3В5. Обзор. Конденсированные среды и межфазные границы, 26(1), 3-24. https://doi.org/10.17308/kcmf.2024.26/11805
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