PHOTOELECTRON SPECTROSCOPY STUDY OF COMMERCIAL METAL TIN FOIL, SnO AND SnO2 OXIDES IN TWO ENERGY RANGES OF THE SYNCHROTRON RADIATION

  • Olga A. Chuvenkova
  • Evelina P. Domashevskaya
  • Stanislav V. Ryabtsev
  • Yurii A. Yurakov
  • Ruslan Ovsyannikov
  • Cui Yitao
  • Son Jin-Young
  • Oji Hiroshi
  • Sergey Yu. Turishchev
Keywords: tin dioxide, tin monoxide, X-ray photoelectron spectroscopy, hard X-ray photoelectron spectroscopy, synchrotron radiation, atomic and electronic structure.

Abstract

Interpretation of the tin — oxygen systems atomic and electronic structure is considerably
complicated due to the large variety of Sn 3d5/2 and O 1s core levels binding energies values for SnO
and SnO2 that can be found in the literature. The aim of this work was the determination of these core
levels binding energy values for the reference commercial samples of tin foil, SnO powder and compact
sample of the tin dioxide SnO2. The used non-destructive techniques was X-ray photoelectron
spectroscopy in the synchrotron soft and hard X-rays allowing the non-destructive study at different
analysis depths and describing the surface (~ 1 nm), and a bulk layers (~ 8 nm) of the samples studied.
As a result, the binding energy values were studied for Sn 3d5/2, O 1s and Sn 4d5/2 core levels of
metallic tin, tin monoxide and dioxide. Valence electrons energy distribution features were studied
as well.

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Author Biographies

Olga A. Chuvenkova

Cand. Sci. (Phys.-Math.), Researcher
of the Solid State Physics and Nanostructures
Department, Voronezh State University; ph.: +7 (473)
2208363, e-mail: chuvenkova@phys.vsu.ru

Evelina P. Domashevskaya

Dr. Sci. (Phys.-Math.),
Full Professor, Head of Solid State Physic and Nanostructures
Department, Voronezh State University; ph.: +7 (473)2208363; e-mail: ftt@phys.vsu.ru

Stanislav V. Ryabtsev

Dr. Sci. (Phys.-Math.), Head
of the Laboratory of the Solid State Physics and Nanostructures
Department, Voronezh State University; ph.: +7 (473)
2208363, e-mail: ryabtsev@niif.vsu.ru

Yurii A. Yurakov

Dr. Sci. (Phys.-Math.), Full Professor,
Solid State Physics and Nanostructures Department,
Voronezh State University; ph.: +7 (473) 2208363, e-mail:
Yurakov@phys.vsu.ru

Ruslan Ovsyannikov

PhD, Researcher, Helmholtz
Zentrum Berlin; ph.: +7 (473) 2208363, e-mail: ovyannikov@
helmholtz-berlin.de

Cui Yitao

PhD, Researcher, Japan Synchrotron Radiation
Institute / SPring8, Japan; ph.: +7 (473) 2208363,
e-mail: tsu@phys.vsu.ru

Son Jin-Young

Researcher, Japan Synchrotron Radiation
Institute / SPring8, Japan; ph.: +7 (473) 2208363,
e-mail: tsu@phys.vsu.ru

Oji Hiroshi

Researcher, Japan Synchrotron Radiation
Institute / SPring8, Japan; ph.: +7 (473) 2208363, e-mail:
tsu@phys.vsu.ru

Sergey Yu. Turishchev

Cand. Sci. (Phys.-Math.),
Senior Researcher of the Solid State Physics and Nanostructures
Department, Voronezh State University; ph.: +7 (473)
2406653, e-mail: tsu@phys.vsu.ru

References

1. Chuvenkova O. A., Domashevskaya E. P., Ryabtsev S. V., Vysotskii D. V., Popov A. E., Yurakov Yu. A., Vilkov O. Yu., Ovsyannikov R., Appathurai N., Turishchev S. Yu. J. of surface investigation. X-ray, synchrotron and neutron techniques, 2014, vol. 8, no. 1, pp. 111—116.
DOI: 10.1134/S102745101401025X Available at: http://link.springer.com/article/10.1134 %2FS102745101401025X
2. Domashevskaya E. P., Chuvenkova O. A., Ryabtsev S. V., Yurakov Yu.A., Kashkarov V. M., Shchukarev A. V., Turishchev S. Yu. Thin Solid Films, 2013, vol.
537, no. 3, pp. 137—144. DOI: 10.1016/j.tsf.2013.03.051 Available at: http://www.sciencedirect.com/science/article/pii/S0040609013004975
3. Chuvenkova O. A., Domashevskaya E. P., Ryabtsev S. V., Yurakov Yu.A., Vysotskii D. V., Vilkov O. Yu., Ovsyannikov R., Turishchev S. Yu. Kondensirovannye sredy i mezhfaznye granitsy, 2013, vol. 15, no. 2, pp. 184—194. Available at: http://www.kcmf.vsu.ru/resources/t_15_2_2013_016.
pdf.
4. Chuvenkova O. A., Ryabtsev S. V., Vysotskii D. V., T u r i s h c h e v S . Yu . , Vi l k o v O . Yu . , D o m ashevskaya E. P. Vestnik Voronezhskogo gosudarstvennogo universiteta. Serija: Fizika. Matematik,. 2012, no. 1, pp. 69—76. Available at: http://www.vestnik.vsu.ru/program/view/view.asp?sec=physmath&year=2012&num=01&f_name=2012—01—10
5. Jiménez V. M., Mejías J. A., Espinós J. P., González-Elipe A. R. Surface Science, 1996, vol. 366, pp. 545—555.
DOI: 10.1016/0039—6028 (96) 00831-X. Available at: h t t p : / / w w w. s c i e n c e d i r e c t . c o m / s c i e n c e / a r t i c l e /
pii/003960289600831X
6. Miche H.-J., Leiste H., Schierbaum K.D, Halbritter J. Applied Surface Science, 1998, vol. 126, pp. 57—64.
DOI: 10.1016/S0169—4332 (97) 00502—3. Available at: http://www.sciencedirect.com/science/article/pii/S0169433297005023
7. Song S.-K., Cho J.-S., Choi W.-K.i, Jung H.-J., Choi D., Lee J.-Y., Baik H.-K., Koh S.-K. Sensors and Actuators B: Chemical, 1998, vol. 46, pp. 42—49. DOI: 10.1016/S0925—4005 (97) 00326—2. Available at: http://www.sciencedirect. com/science/article/pii/S0925400597003262
8. Alfa Aesar materials company. Available at: http://www.alfa.com/ru/gp140w.pgm
9. Crist B. V. XPS International Inc., 1999, vol. 1. Available at: www.xpsdata.com
10. Kover L., Kovacrs Zs., Sanjines R., Meretti G., Cserny I., Margaritondo G., Palinkas J., Adachi H. Surface and interface analysis, 1995, vol. 23, pp. 461—466. DOI: 10.1002/sia.740230705. Available at: http://onlinelibrary. wiley.com/doi/10.1002/sia.740230705/abstract
11. Sinner-Hettenbach M., Barsan N., Weimara U., Weiß T., von Schenck H., G¨othelid M., Giovanelli L., Le Lay G. Thin Solid Films, 2001, vol. 391, pp. 192—197. DOI: 10.1016/S0040—6090 (01) 00981—6. Available at: http://www.sciencedirect.com/science/article/pii/S0040609001009816
12. Nagasawa Y., Choso T., Karasuda T., et al. Surf. Sci, 1999, vol. 433—435, pp. 226—229. DOI: 10.1016/S0039—6028 (99) 00044—8. Available at: http://www.sciencedirect.com/science/article/pii/S0039602899000448
13. Jerdev D. I., Koel B. E. Surf. Sci, 2001, vol. 492, pp. 106—114. DOI: 10.1016/S0039—6028 (01) 01407—8.Available at: http://www.sciencedirect.com/science/article/pii/S0039602801014078.
14. XPS element energy database. Available at: http://www.lasurface.com/database/elementxps. php
15. Barreca D., Garon S., Tondello E., Zanella P. Surf. Sci. Spectra, 2000, vol. 7, pp. 81—85. Available at: http://dx.doi.org/10.1116/1.1288177
16. Padova P. De, Fanfoni M., Larciprete R., Mangiantini M., Priori S., Perfetti P. Surf. Sci, 1994, vol. 313, pp. 379—391. DOI: 10.1016/0039—6028 (94) 90058—2. Available at: http://www.sciencedirect.com/science/article/pii/0039602894900582
Published
2014-12-25
How to Cite
Chuvenkova, O. A., Domashevskaya, E. P., Ryabtsev, S. V., Yurakov, Y. A., Ovsyannikov, R., Yitao, C., Jin-Young, S., Hiroshi, O., & Turishchev, S. Y. (2014). PHOTOELECTRON SPECTROSCOPY STUDY OF COMMERCIAL METAL TIN FOIL, SnO AND SnO2 OXIDES IN TWO ENERGY RANGES OF THE SYNCHROTRON RADIATION. Condensed Matter and Interphases, 16(4), 513-522. Retrieved from https://journals.vsu.ru/kcmf/article/view/867
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