On the formation of the Ag2Si metastable phase in an Ag-Si film obtained by ion-beam sputtering

Authors

  • Konstantin A. Barkov Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation
  • Vitaly V. Babakov Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation
  • Gennady P. Potudansky Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation
  • Sergey A. Ivkov Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation
  • Yaroslav A. Peshkov Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation
  • Ivan V. Polshin Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation
  • Evgenii S. Kersnovsky Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation
  • Selby Y. Khydyrova Bauman Moscow State Technical University, 2nd Baumanskaya st., 5, p. 1, Moscow 105005, Russian Federation
  • Konstantin M. Moiseev Bauman Moscow State Technical University, 2nd Baumanskaya st., 5, p. 1, Moscow 105005, Russian Federation
  • Igor E. Zanin Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation
  • Alexandra K. Pelagina Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation
  • Nikita S. Buylov Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation
  • Van Tu Tran University of Medicine and Pharmacy at Ho Chi Minh city, 217 Hong Bang Street, Wars 11, District 5, HCMC, Viet Nam
  • Alexandr E. Nikonov Voronezh State Technical University, 84 20 let Oktyabrya st., Voronezh 394006, Russian Federation
  • Aleksandr V. Sitnikov Voronezh State Technical University, 84 20 let Oktyabrya st., Voronezh 394006, Russian Federation

DOI:

https://doi.org/10.17308/kcmf.2026.28/13555

Keywords:

Metastable Ag-Si-based phases, AgSi3, Ag2Si, Ag3Si, silver silicides, ion-beam sputtering, Ultra-soft X-ray emission spectroscopy (USXES), Electronic density of states (DOS)

Abstract

Objectives: Nanocomposite films based on Ag-Si compounds have application in many areas of science and technology. However, their manufacturing process can be accompanied by the formation of silicides and metastable phases. In this connection, the task of developing methods for their identification arises. In this work, we attempted to solve this task using X-ray diffraction, ultra-soft X-ray emission spectroscopy, and theoretical calculations of the electron density of states for an Ag55Si45 film obtained by ion-beam sputtering of a composite target.

Experimental: As a result of comprehensive studies, a nanogranular structure of the film was revealed, with an average silver particle size of ~15 nm, separated by a matrix based on phases of amorphous silicon a-Si, SiO2, and suboxide SiO1.3, as well as a silver silicide phase. A comparison of the experimental Si L2.3 X-ray emission spectrum of the Ag55Si45 film with theoretically calculated spectra of the AgSi3, Ag2Si, and Ag3Si phases shows the best agreement with the spectrum of the Ag2Si phase. Moreover, the Ag2Si phase was detected in the works of other authors. 

Conclusions: Thus, based on X-ray diffraction, X-ray emission spectroscopy, and theoretical calculations of the electronic density of states, it has been established that a metastable Ag2Si phase is formed in the Ag55Si45 film produced by ion-beam sputtering

Downloads

Download data is not yet available.

Author Biographies

  • Konstantin A. Barkov, Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation

    Cand. Sci. (Phys.-Math.), Head of the Laboratory, Department of Solid State Physics and Nanostructures, Voronezh State University (Voronezh, Russian Federation)

  • Vitaly V. Babakov, Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation

    student, Department of Solid State Physics and Nanostructures, Voronezh State University (Voronezh, Russian Federation)

  • Gennady P. Potudansky, Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation

    Lead Data Analyst, RT Labs JSC (Voronezh, Russian Federation)

  • Sergey A. Ivkov, Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation

    Cand. Sci. (Phys.-Math.), Leading Electronics Engineer, Department of Solid State Physics and Nanostructures, Voronezh State University (Voronezh, Russian Federation)

  • Yaroslav A. Peshkov, Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation

    Cand. Sci. (Phys.-Math.), Research Associate, Department of Solid State Physics and Nanostructures, Voronezh State University (Voronezh, Russian Federation)

  • Ivan V. Polshin, Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation

    student, Department of Solid State Physics and Nanostructures, Voronezh State University (Voronezh, Russian Federation)

  • Evgenii S. Kersnovsky, Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation

    student, Department of Solid State Physics and Nanostructures, Voronezh State University (Voronezh, Russian Federation)

  • Selby Y. Khydyrova, Bauman Moscow State Technical University, 2nd Baumanskaya st., 5, p. 1, Moscow 105005, Russian Federation

    postgraduate student, Department of Electronic Technologies in Mechanical Engineering, Bauman Moscow State Technical University (Moscow, Russian Federation)

  • Konstantin M. Moiseev, Bauman Moscow State Technical University, 2nd Baumanskaya st., 5, p. 1, Moscow 105005, Russian Federation

    Assistant Professor, Department of Electronic Technologies in Mechanical Engineering, Bauman Moscow State Technical University (Moscow, Russian Federation)

  • Igor E. Zanin, Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation

    Cand. Sci. (Phys.-Math.), Assistant Professor, General Physics Department, Voronezh State University (Voronezh, Russian Federation)

  • Alexandra K. Pelagina, Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation

    Engineer-Physicist, Voronezh State University (Voronezh, Russian Federation)

  • Nikita S. Buylov, Voronezh State University, 1 Universitetskaya pl., Voronezh 394018, Russian Federation

    Cand. Sci. (Phys.-Math.), Assistant Professor, Department of Solid State Physics and Nanostructures, Voronezh State University; Engineer, Research Institute of Electronic Technology (Voronezh, Russian Federation)

  • Van Tu Tran, University of Medicine and Pharmacy at Ho Chi Minh city, 217 Hong Bang Street, Wars 11, District 5, HCMC, Viet Nam

    Lecturer, Faculty of Fundamental Sciences, Department of Physics, University of Medicine and Pharmacy at Ho Chi Minh city (Ho Chi Minh city, Viet Nam)

  • Alexandr E. Nikonov, Voronezh State Technical University, 84 20 let Oktyabrya st., Voronezh 394006, Russian Federation

    Cand. Sci. (Phys.-Math.), Research Engineer, Department of Solid-State Electronics, Voronezh State Technical University (Voronezh, Russian Federation)

  • Aleksandr V. Sitnikov, Voronezh State Technical University, 84 20 let Oktyabrya st., Voronezh 394006, Russian Federation

    Dr. Sci. (Phys.-Math.), Full Professor, Departments of Solid-State Electronics, Voronezh State Technical University (Voronezh, Russian Federation)

References

1. Yang Z. W., Meng L. Y., Lin J. S., … Li J. F. 3D hotspots platform for plasmon enhanced Raman and second harmonic generation spectroscopies and quantitative analysis. Advanced Optical Materials. 2019;7: 3–8. https://doi.org/10.1002/adom.201901010

2. Ermina A. A., Solodovchenko N. S., Levitskii V. S., … Zharova Y. A. Plasmonic disordered array of hemispherical AgNPs on SiO2@c-Si: their optical and SERS properties. Materials Science in Semiconductor Processing. 2024;169: 107861. https://doi.org/10.1016/j.mssp.2023.107861

3. Dzhagan V., Mazur N., Kapush O., … Yukhymchuk V. Self-organized SERS substrates with efficient analyte enrichment in the hot sSpots. ACS Omega. 2024;9(4): 4819–4830. https://doi.org/10.1021/acsomega.3c08393

4. Kukushkin V. I., Van’kov A. B., Kukushkin I. V. Relationship between the giant enhancement of the Raman scattering and luminescence on nanostructured metallic surfaces. Journal of Experimental and Theoretical Physics Letters. 2013;98(6): 342–347. https://doi.org/10.1134/S0021364013190089

5. Ghosh R., Ghosh J., Das R., … Giri P. K. Multifunctional Ag nanoparticle decorated Si nanowires for sensing, photocatalysis and light emission applications. Journal of Colloid and Interface Science. 2018;532: 464-473. https://doi.org/10.1016/j.jcis.2018.07.123

6. Poletaeva D. A., Khakina E. A., Kukushkin V. I., … Kotelnikov A. I. Application of SERS spectroscopy for detection of water-soluble fullerene C60 derivatives and their covalent conjugates with dyes. Doklady Physical Chemistry. 2015;460(1): 1–5. https://doi.org/10.1134/S0012501615010017

7. Morawiec S., Mendes M. J., Priolo F., Crupi I. Plasmonic nanostructures for light trapping in thin-film olar cells. Materials Science in Semiconductor Processing. 2019;92: 10–18. https://doi.org/10.1016/j.mssp.2018.04.035

8. Atwater H. A., Polman A. Plasmonics for improved photovoltaic devices. Nature Materials. 2010;9: 205–213. https://doi.org/10.1038/nmat2629

9. Polat D. B., Eryilmaz L., Keles O. Generation of AgSi film by magnetron sputtering for use as anodes in lithium ion batteries. ECS Meeting Abstracts. 2015;MA2015-01: 514–514. https://doi.org/10.1149/ma2015-01/2/514

10. Liu B., Xu G., Jin C., … Zhou L. The Si/Ag2Si/Ag particles with the enhanced mechanical contact as anode material for lithium ion batteries. Materials Letters. 2020; 280: 128536. https://doi.org/10.1016/j.matlet.2020.128536

11. Li R., Yang H., Zhang Y., … Huang P. Physical mechanisms and enhancement of endurance degradation of SiOx:Ag-based volatile memristors. 2023 Silicon Nanoelectronics Workshop (SNW). 2023;40: 117–118. https://doi.org/10.23919/SNW57900.2023.10183918

12. Ding X., Huang P., Zhao Y., Feng Y., Liu L. Understanding of the volatile and nonvolatile switching in Ag-based memristors. IEEE Transactions on Electron Devices. 2022; 69: 1034–1040. https://doi.org/10.1109/TED.2022.3144373

13. Dias C., Lv H., Picos R., …Ventura J. Bipolar resistive switching in Si/Ag nanostructures. Applied Surface Science. 2017; 424: 122–126. https://doi.org/10.1016/j.apsusc.2017.01.140

14. Sarkar D. K., Cloutier F., El Khakani M. A. Electrical switching in sol-gel derived Ag-SiO2 nanocomposite thin films. Journal of Applied Physics. 2005;97: 2–7. https://doi.org/10.1063/1.1870112

15. Jo S. H., Kim K. H., Chang T., Gaba S., Lu W. Si memristive devices applied to memory and neuromorphic circuits. In: Proceedings of 2010 IEEE International Symposium on Circuits and Systems, May 2010, IEEE; 2010. p. 13–16. https://doi.org/10.1109/iscas.2010.5537135

16. Huang C. Size-dependent behavior and challenges in Ag/Al2O3/Au memristors: an investigation into miniaturization effect. Mechanical Engineering and Materials Science Independent Study. 2023. https://doi.org/10.7936/r37p-cf73

17. Xu W., Wang J., Yan X. Advances in memristor-based neural networks. Frontiers in Nanotechnology. 2021;3: 645995. https://doi.org/10.3389/fnano.2021.645995

18. Zhang B., Kutalek P., Knotek P., … Wagner T. Investigation of the resistive switching in AgxAsS2 layer by conductive AFM. Applied Surface Science. 2016;382: 336–340. https://doi.org/10.1016/j.apsusc.2016.04.152

19. Jeong W. H., Han J. H., Choi B. J. Effect of Ag concentration dispersed in HfOx thin films on threshold switching. Nanoscale Research Letters. 2020;15(1): 27 https://doi.org/10.1186/s11671-020-3258-6

20. Yoo J., Woo J., Song J., Hwang H. Threshold switching behavior of Ag-Si based selector device and hydrogen doping effect on its characteristics. AIP Advances. 2015;5(12): 127221. https://doi.org/10.1063/1.4938548

21. Ilyas N., Wang J., Li C., … Li W. Controllable resistive switching of STO: Ag/SiO2-based memristor synapse for neuromorphic computing. Journal of Materials Science & Technology. 2022;97: 254–263. https://doi.org/10.1016/j.jmst.2021.04.071

22. Cha J. H., Yang S. Y., Oh J., … Choi S. Y. Conductivebridging random-access memories for emerging neuromorphic computing. Nanoscale. 2020;12: 14339–14368. https://doi.org/10.1039/d0nr01671c

23. Sokolov A. S., Abbas H., Abbas Y., Choi C. Towards engineering in memristors for emerging memory and neuromorphic computing: a review. Journal of Semiconductors. 2021;42(1): 013101. https://doi.org/10.1088/1674-4926/42/1/013101

24. Raeis-Hosseini N., Lim S., Hwang H., Rho J. Reliable Ge2Sb2Te5-integrated high-density nanoscale conductive bridge random access memory using facile nitrogen-doping strategy. Advanced Electronic materials. 2018;4(11). https://doi.org/10.1002/aelm.201800360

25. Olesinski R. W., Gokhale A. B., Abbaschian G. J. The Ag-Si (Silver-Silicon) system. Bulletin of Alloy Phase Diagrams. 1989;10(6): 635–640. https://doi.org/10.1007/BF02877631

26. Anantharaman T. R., Luo H. L., Element W. Formation of new intermetallic phases in binary eutectic systems by drastic undercooling of the melt. Nature. 1966;210.(5040): 1040–1041. https://doi.org/10.1038/2101040a0

27. Terekhov V. A., Domashevskaya E. P., Kurganskii S. I., … Agapov B. L. Formation of the Al3Si metastable phase in Al-Si films obtained by ion-beam sputtering according to experimental and theoretical data. Thin Solid Films. 2023;772: 139816. https://doi.org/10.1016/j.tsf.2023.139816

28. Suryanarayana C. A new metastable phase in the silver-silicon system. Journal of the Less Common Metals. 1974;35(2): 347–352. https://doi.org/10.1016/0022-5088(74)90248-3

29. Lee W. S., Chen T. H., Lin C. F., Wu C. L. Microstructural evolution of nanoindented Ag/Si thin-film under different annealing temperatures. Materials Transactions. 2011;52(10): 1868–1875. https://doi.org/10.2320/matertrans.M2011160

30. Liu B., Xu G., Jin C., … Zhou L. The Si/Ag2Si/Ag particles with the enhanced mechanical contact as anode material for lithium ion batteries. Materials Letters. 2020; 280: 128536. https://doi.org/10.1016/j.matlet.2020.128536

31. Materials Explorer Database. Data retrieved from the Materials explorer for AgSi3 (mp-978524) database: version 2025.06.09. Available at: https://next-gen.materialsproject.org/materials/mp-978524

32. Materials Explorer Database. Data retrieved from the Materials Explorer for Ag3Si (mp-1219243) database: version 2025.06.09. Available at: https://next-gen.materialsproject. org/materials/mp-1219243?material_ids=mp-1219243

33. Nakayama K. S., Nishijima M., Zhang Y., … Suganuma K. Metastable phases of Ag–Si: amorphous Si and Ag-nodule mediated bonding. Scientific Reports. 2024;14(1): 1–9. https://doi.org/10.1038/s41598-024-70298-6

34. Cassidy C., Singh V., Grammatikopoulos P., … Sowwan M. Inoculation of silicon nanoparticles with silver atoms. Scientific Reports. 2013;3: 1–7 https://doi.org/10.1038/srep03083

35. Barkov K. A., Terekhov V. A., Nesterov D. N., … Sitnikov A. V. Formation of silver nanocrystals in Ag-Si composite films obtained by ion beam sputtering. Condensed Matter and Interphases. 2024;26(3), 407–416. https://doi.org/10.17308/kcmf.2024.26/12215

36. Zimkina T. M., Fomichev V. A. Ultrasoft X-ray spectroscopy. . Leningrad University Pub. House; 1971. 125 p.

37. Zimmermann P., Peredkov S., Abdala P. M., … van Bokhoven J. A. Modern X-ray spectroscopy: XAS and XES in the laboratory. Coordination Chemistry Reviews. 2020;423: 213466. https://doi.org/10.1016/j.ccr.2020.213466

38. Terekhov V. A., Kashkarov V. M., Manukovskii E. Yu., Schukarev A. V., Domashevskaya E. P. Determination of the phase composition of surface layers of porous silicon by ultrasoft X-ray spectroscopy and X-ray photoelectron spectroscopy techniques. Journal of Electron Spectroscopy and Related Phenomena. 2001;114–116: 895–900. https://doi.org/10.1016/S0368-2048(00)00393-5

39. Blaha P., Schwarz K., Tran F., … Marks L. D. WIEN2k: An APW+lo program for calculating the properties of solids. The Journal of Chemical Physics. 2020;152(7): 074101. https://doi.org/10.1063/1.5143061

40. Momma K., Izumi F. VESTA 3 for three-dimensional visualization of crystal, volumetric and morphology data. Applied Crystallography. 2011;44(6): 1272–1276. https://doi.org/10.1107/S0021889811038970

41. SpringerMaterials: The Landolt-Börnstein Database. Data retrieved from the SpringerMaterials for structural data № 0450926 database: version 2025. Available at: https://materials.springer.com/isp/crystallographic/docs/sd_0450926

42. Langford J. I., Wilson A. J. C. Scherrer after sixty years: a survey and some new results in the determination of crystallite size. Journal of Applied Crystallography. 1978;11: 102–113. https://doi.org/10.1107/S0021889878012844

43. Hassanzadeh-Tabrizi S. A. Precise calculation of crystallite size of nanomaterials: a review. Journal of Alloys and Compounds. 2023:968: 171914. https://doi.org/10.1016/j.jallcom.2023.171914

44. Kurganskii S. I., Pereslavtseva N. S. Electronic structure of FeSi2. Physics of the Solid State. 2002;44(4): 704–708. https://doi.org/10.1134/1.1470562

45. Kurganskii S. I., Pereslavtseva N. S. Electronic structure of сobalt disilicide film. Physics of the Solid State. 2000;42(8): 1542–1547. https://doi.org/10.1134/1.1307068

46. Pereslavtseva N. S, Kurganskii S. I. Electronic structure and spectral properties of nickel disilicide films. Physics of the Solid State. 1999;41(11): 1906–1910. https://doi.org/10.1134/1.1131124

47. Sarkar D. K., Dhara S., Nair K. G. M., Chowdhury S. Studies of phase formation and chemical states of the ion beam mixed Ag/Si (1 1 1) system. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 2000;168(2): 215–220. https://doi.org/10.1016/S0168-583X(99)00876-9

48. Weijs P. J. W., Van Leuken H., De Groot R. A., … Buschow K. H. J. X-ray-emission studies of chemical bonding in transition-metal silicides. Physical Review B. 1991;44(15): 8195. https://doi.org/10.1103/PhysRevB.44.8195

Published

2026-04-01

Issue

Section

Original articles

How to Cite

On the formation of the Ag2Si metastable phase in an Ag-Si film obtained by ion-beam sputtering. (2026). Kondensirovannye Sredy I Mezhfaznye Granitsy = Condensed Matter and Interphases, 28(1), 15-27. https://doi.org/10.17308/kcmf.2026.28/13555

Most read articles by the same author(s)

1 2 > >>